Scanning electron microscopy (SEM) enables high-resolution investigation of surface structures, morphologies, and material properties in the micro- and nanometer range.
The detailed visualization of particles, fibers, layers, and surfaces allows structure–property relationships to be analyzed and supports development, optimization, and failure analysis processes.
- Investigation of morphology and surface structure
- Determination of particle shape and size distribution
- Analysis of agglomeration and dispersion states
- Characterization of surface roughness and defects
- Investigation of foreign particles
- Comparative analysis of materials and manufacturing processes
Sample Requirements
Sample requirements depend on the material properties and the objective of the analysis. Suitable sample types include, for example, powders, particles, fibers, coatings, biomaterials, and solid surfaces. Nanomaterials can be deposited from dispersions onto suitable substrates. If required, non-conductive samples are coated with a thin conductive layer prior to measurement.
Elemental Analysis (EDX)
In addition to SEM imaging, energy-dispersive X-ray spectroscopy (EDX) can be used to analyze the elemental composition and distribution of inorganic constituents.
- Qualitative and semiquantitative elemental analysis
- Elemental distribution analysis (mapping, line scans, and point analyses)
- Identification of inorganic constituents and contaminants
Fraunhofer Institute for Cell Therapy and Immunology, Branch Bioanalytics and Bioprocesses IZI-BB
